TranCT-215 is a system developed for the distributed measurement of the transmission loss of photonic chips at the chip level, packaging, integration and other detection links. The system has ultra-high loss detection dynamic range and sensitivity, ultra-high spatial resolution and loss event location accuracy. At the same time, the device takes into account excellent control software development capabilities, provides more flexible hardware and software matching solutions, and has extremely high adaptability to be integrated into any established photonic chip test platform.

Features:

The test light band can be flexibly customized

Spatial resolution up to 20um

Return loss test sensitivity can reach -135dB

Return loss test dynamic range 80dB

Insertion loss test dynamic range 18dB

Support customized software development

Flexible hardware + software integration solution

typical application:

Photonic chip transmission loss measurement

On-chip loss event location analysis

Analysis of Optical Link Loss in Optical Components

On-chip optical link delay measurement